Laser Photonics Corp

RIF BAA 11-032

200202!000011!5700!GR10 !AFRL/MLKT MANUFACTURING TECH !F3361501C5700 !A!N! !N! !20011002!20040209!927253195!927253195!927253195!N!MOUND LASER & PHOTONICS CENTER!720 MOUND AVE !MIAMISBURG !OH!45342!49434!113!39!MIAMISBURG !MONTGOMERY !OHIO !+000000375000!N!N!000000000000!AZ16!RDTE/OTHER RESEARCH & DEVELOPMENT-MGMT SUPPORT !C9E!ALL OTHER SUPPLIES AND EQUIPME!3000!NOT DISCERNABLE OR CLASSIFIED !541710!E! !3! ! ! ! ! !99990909!B! ! !N!Z!A!N!U!2!002!K! !Z!N!Z! ! !N!B!N!N! ! !A! !B!A!000!C!B!N! ! ! ! ! ! !0001!

200608!601605!2100!W9113M!USA SPACE AND STRATEGIC DEF CDR !W9113M06C0117 !A!N! !N! ! !20060511!20080509!927253195!927253195!927253195!N!MOUND LASER & PHOTONICS CENTER!720 MOUND AVE !MIAMISBURG !OH!45342!49434!113!39!MIAMISBURG !MONTGOMERY !OHIO !+000000699885!N!N!000000699885!AC23!RDTE/MISSILE AND SPACE SYSTEMS-ADV TECH DEV !A2 !MISSILE AND SPACE SYSTEMS !000 !NOT DISCERNABLE !541710!E! !3! ! ! ! ! !99990909!B! ! !A! !A!U!J!2!001!K! !Z!N!Z! ! !N!B!N!N! ! !A! !B!A!000!C!B!N! ! ! ! ! ! !0001! !

FSC: J036 NAME: NEW LASER JET PART NUMBER:

SBIR PHASE II

IGF::OT::IGF IN PHASE I OF THIS PROJECT MLPC, WSU, AND AFIT WERE SUCCESSFULLY ABLE TO IDENTIFY SEVERAL OPTICAL DATA FEATURES THAT ARE INDICATIVE OF THE QUALITY OF COMPONENTS BUILT WITH THE SELECTIVE LASER MELTING ADDITIVE MANUFACTURING PROCESS. FOUR UNIQUE OPTICAL SENSORS WERE IDENTIFIED TO COLLECT THIS INFORMATION AND THEY INCLUDE INFRARED AND VISIBLE WAVELENGTH HIGH-SPEED CAMERAS AND SPECTROMETERS. THE SENSORS USED IN PHASE I WERE VERY EXPENSIVE, UNIVERSITY DEVELOPED, AND PRODUCE VERY BIG DATA SETS. IN THIS PHASE II PROPOSAL MLPC AND THEIR COLLABORATORS WILL CONTINUE THIS WORK BY DEVELOPING A NEW LOW-COST SENSOR SYSTEM TO SPECIFICALLY TRACK KEY DATA FEATURES IDENTIFIED IN PHASE I. THIS SENSOR SYSTEM WILL THEN BE USED TO PERFORM IN-PROCESS QUALITY MONITORING AND QUALIFICATION OF MANUFACTURED PARTS. IN PHASE II THIS ANALYSIS WILL ALSO BE EXTENDED TO ELECTRON BEAM FREEFORM FABRICATION. TO COMPLETE THE PROJECT MLPC, WSU, AND AFIT WILL CONTINUE ANALYSIS OF THE PHASE I SENSOR DATA TO IDENTIFY MORE OBSCURE PROCESS QUALITY DATA, AND DEVELOP PROCESS MAPS THAT CORRELATE SENSOR OUTPUT TO PART MICROSTRUCTURE. THEN MLPC AND AFIT WILL DESIGN AND BUILD THE LOW-COST SENSOR SYSTEM TO TRACK ALL KEY DATA, AND TEST IT ON MLPCS CUSTOM BUILD ADDITIVE MANUFACTURING TEST CELL. NEXT MLPC WILL PERFORM THE NECESSARY PROGRAMMING AND DATA PROCESSING TO IMPLEMENT A PROCESS MONITORING SYSTEM THAT WILL SHOW SENSOR DATA POSITION ON THE PROCESS MAPS IN REAL-TIME, THUS ENABLING IN-PROCESS QUALITY ASSURANCE. MLPC WILL THEN STUDY AND REPORT THE COST SAVINGS NASA COULD GAIN WITH THIS TECHNOLOGY. FINALLY, MLPC WILL TEST THIS CONCEPT ON AN ELECTRON BEAM SYSTEM AND DETERMINE ITS VIABILITY FOR THAT PROCESS. AT THE END OF PHASE II THE TRL WILL BE 5, AND THIS PRODUCT WILL BE READY FOR LICENSING FOR COMMERCIAL USE IN EXISTING ADDITIVE MANUFACTURING MACHINES, AND THE MLPC DEVELOPED ADDITIVE MANUFACTURING SYSTEM WILL BE AVAILABLE FOR LICENSING AS A PACKAGE UNIT WITH THE INTEGRATED SENSOR SYSTEM.

BROADBAND MULTISPECTRAL MID-INFRARED LASER. PHOTONIC INTEGRATED CIRCUITS

200512!502640!2100!W9113M!USA SPACE AND STRATEGIC DEF CDR !W9113M05C0207 !A!N! !N! ! !20050916!20070917!927253195!927253195!927253195!N!MOUND LASER & PHOTONICS CENTER!720 MOUND AVE !MIAMISBURG !OH!45342!49434!113!39!MIAMISBURG !MONTGOMERY !OHIO !+000000749720!N!N!000000000000!AC23!RDTE/MISSILE AND SPACE SYSTEMS-ADV TECH DEV !A2 !MISSILE AND SPACE SYSTEMS !CAA !MDA SUPPORT !541710!E! !3! ! ! ! ! !20200930!B! ! !B! !A!U!J!2!023!K! !Z!N!Z! ! !N!B!N!N! ! !A! !B!A!000!C!B!N! ! ! ! ! ! !0001! !

IGF::OT::IGF COMPUTATIONAL PROCESS MODEL DEVELOPMENT FOR DIRECT DIGITAL MFG

R & D PHASE II TOPIC N07-176